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JAN1N3826A Specifications

Detailed technical information and Application Scenarios

Product Details

PartNumberManufactorQuantityAvailability
JAN1N3826AMicrosemi409Yes

JAN1N3826A is a high-reliability, military-grade silicon power rectifier manufactured by Microsemi.

The JAN1N3826A is a high-reliability, military-grade silicon power rectifier manufactured by Microsemi.

Specifications:

  • Type: Silicon Power Rectifier
  • Voltage Rating (VRRM): 200V
  • Average Forward Current (IF(AV)): 1A
  • Peak Forward Surge Current (IFSM): 30A (non-repetitive)
  • Forward Voltage Drop (VF): 1.1V (typical at 1A)
  • Reverse Leakage Current (IR): 5µA (max at 200V)
  • Operating Temperature Range: -65°C to +175°C
  • Junction Temperature (TJ): 175°C
  • Package: DO-35 (Axial Lead)
  • Qualification: MIL-PRF-19500/522, JANTX, JAN

Descriptions:

  • Designed for high-reliability military and aerospace applications.
  • Hermetically sealed for rugged environments.
  • Suitable for power supply, voltage regulation, and rectification circuits.

Features:

  • High surge current capability.
  • Low forward voltage drop.
  • Excellent thermal stability.
  • MIL-SPEC qualified for stringent reliability requirements.

This part is intended for critical applications where performance and durability are essential.

# JAN1N3826A: Technical Analysis and Implementation Considerations

## Practical Application Scenarios

The JAN1N3826A is a military-grade, high-reliability Zener diode manufactured by Microsemi, designed for precision voltage regulation and protection in harsh environments. Its primary applications include:

1. Voltage Regulation in Aerospace Systems

The diode’s tight tolerance (±5%) and stable breakdown voltage (6.2V) make it ideal for regulating supply voltages in avionics and satellite systems, where fluctuations can compromise sensitive circuitry.

2. Transient Suppression in Military Electronics

The JAN1N3826A serves as a robust clamp for transient voltage suppression (TVS) in radar and communication equipment, protecting downstream components from voltage spikes induced by electromagnetic interference (EMI) or power surges.

3. Reference Voltage Generation

In precision analog circuits, such as data acquisition systems, the diode provides a stable reference voltage due to its low dynamic impedance and temperature stability.

4. Power Supply Protection

The component is often deployed in redundant power supply designs to prevent overvoltage conditions, ensuring fail-safe operation in critical infrastructure like medical and defense systems.

## Common Design-Phase Pitfalls and Avoidance Strategies

1. Thermal Runaway in High-Current Applications

*Pitfall:* Excessive power dissipation can cause thermal runaway, leading to diode failure.

*Solution:* Derate the diode’s power rating (500mW at 25°C) by 3.3mW/°C above 50°C and use heatsinks or parallel diodes for higher loads.

2. Inadequate Voltage Margin

*Pitfall:* Operating near the Zener voltage’s knee region results in poor regulation.

*Solution:* Design for a bias current ≥10mA to ensure operation in the optimal breakdown region.

3. Improper PCB Layout

*Pitfall:* Long trace lengths introduce parasitic inductance, degrading transient response.

*Solution:* Place the diode close to the protected load and use short, wide traces to minimize impedance.

4. Misapplication in AC Circuits

*Pitfall:* Unidirectional clamping fails in AC systems.

*Solution:* Use back-to-back Zeners or select a bidirectional TVS diode for AC line protection.

## Key Technical Considerations for Implementation

1. Breakdown Voltage Tolerance

Verify the actual breakdown voltage (Vz) under operating conditions, as it varies with temperature and current.

2. Dynamic Impedance

A low dynamic impedance (≤10Ω) ensures minimal output voltage variation under load changes.

3. Temperature Coefficients

The JAN1N3826A’s near-zero temperature coefficient at 6.2V minimizes drift, but derating is necessary for extreme environments.

4. Reliability Testing

Leverage MIL-PRF-19500 qualification data to validate lifetime performance in mission-critical applications.

By addressing these factors, designers can optimize the JAN1N3826A’s performance while mitigating risks in high-stakes deployments.

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